Semiconductors are essential to our modern society and can be found in everything from microelectronics to photovoltaics. Research into this material continues to discover new applications as efforts are made to develop smaller and more efficient structures.
Quark Photonics partners with these researchers by providing a broad range of instrumentation focused on the characterisation and quality control of semiconductors. From PL and Raman to Quantum Yield, particle size and thin film metrology, Quark Photonics supports your semiconductor research.
LabRAM HR Evolution
Raman Spectroscopy
Key Applications
- PL/Raman measurements on a single benchtop system
- Strain measurements and chemical distribution
- Band Gap Determination
- Impurity Levels and Defect Detection
- Material Quality
- PL/Raman imaging
- Sub-micron PL/Raman
- Confocal microscope
- Time resolved PL
- Cryogenic PL
- Confocal microscope
- Multi-wavelength excitation and broad detection range
Nanolog
Fluorescence Spectroscopy
Key Applications
- Photoluminescence Quantum Yield and fluorescence lifetime measurements
- Pl and PLE of GaN
- Size and compositional studies of Quantum Dots
MicOS
Optical Spectrometer Microscope
Key Applications
- PL Microscope Spectrometer
- Photoluminescence Quantum Yield measurements (PLQY)
- Wide detection range from UV-NIR
- Rapid PL mapping of entire wafers
- Multi-wavelength excitation for various materials and depth penetration
- Time-resolved PL
GD-Profiler 2
Glow Discharge
Key Applications
- Glow Discharge elemental depth profiling
- Provides rapid analysis of complex layered semiconductor structures – sometimes up to 100 layers thick.
UVISEL 2
Ellipsometry
Key Applications
- Applications in semiconductor research and microelectronic industries
- Characterisation of thin film thickness, optical constants, bandgap, crystallinity, interfaces and more of multilayer structures
- Broad spectral range from DUV to NIR
FLAME
Miniature Modular Spectrometer
Key Applications
- Plasma monitoring to control plasma based coating and etching techniques.
- Modular nature allows flexibility
- Can be tailored to your application or plasma chamber.
NanoCalc
Reflectometry
Key Applications
- Layer thickness of semiconductor coatings
- Wafer mapping
- Transmission and reflectometry measurements
- Optical and non-optical thin film thickness characteristics
